11 US patent applications published on 27 March 2008 and assigned to Micron
| 1 | 20080076263 | Method of reducing electron beam damage on post W-CMP wafers |
| 2 | 20080075386 | Extended Depth of Field Using a Multi-Focal Length Lens with a Controlled Range of Spherical Aberration and a Centrally Obscured Aperture |
| 3 | 20080074933 | RANDOM CACHE READ |
| 4 | 20080074852 | Elimination of RDL using tape base flip chip on flex for die stacking |
| 5 | 20080074525 | Double sample active pixel sensor with double sampling temperature sensor |
| 6 | 20080074524 | Skimmed charge capture and charge packet removal for increased effective pixel photosensor full well capacity |
| 7 | 20080074523 | In-pixel analog memory with non-destructive read sense circuit for high dynamic range global shutter pixel operation |
| 8 | 20080074174 | Current mirror circuit having drain-source voltage clamp |
| 9 | 20080073758 | Method and apparatus for directing molding compound flow and resulting semiconductor device packages |
| 10 | 20080073687 | Memory Array Buried Digit Line |
| 11 | 20080073638 | Programmable resistance memory devices and systems using the same and methods of forming the same |
