28 US patent applications published on 31 July 2008 and assigned to Hitachi
| 1 | 20080184347 | Storage system and method for connecting additional storage apparatus |
| 2 | 20080184255 | Storage apparatus and load distribution method |
| 3 | 20080184000 | STORAGE MODULE AND CAPACITY POOL FREE CAPACITY ADJUSTMENT METHOD |
| 4 | 20080183994 | STORAGE SYSTEM |
| 5 | 20080183993 | Method for remote backup and storage system |
| 6 | 20080183871 | Storage system comprising function for alleviating performance bottleneck |
| 7 | 20080183841 | Application software and data management method, management system, and thin client terminal, management server and remote computer used therefor |
| 8 | 20080183774 | CONTROL DEVICE AND METHOD FOR DATA MIGRATION BETWEEN NAS DEVICES |
| 9 | 20080183432 | Environmental information aggregating apparatus and method |
| 10 | 20080183348 | Hybrid Cruising Control System |
| 11 | 20080182612 | Radio Communication System and Base Station |
| 12 | 20080182426 | Method for growing nitride semiconductor |
| 13 | 20080182414 | MASS PRODUCTION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD OF ELECTRONIC DEVICE |
| 14 | 20080182345 | Substrate processing method and semiconductor manufacturing apparatus |
| 15 | 20080182159 | CYLINDRICAL SECONDARY BATTERY |
| 16 | 20080182134 | Perpendicular magnetic recording media and magnetic storage apparatus using the same |
| 17 | 20080181604 | Optical access system |
| 18 | 20080181349 | Nuclear Power Plant and Operation Method Thereof |
| 19 | 20080181312 | Television receiver apparatus and a frame-rate converting method for the same |
| 20 | 20080181090 | Objective lens optical system and light beam splitting element |
| 21 | 20080180839 | Magnetic disk drive |
| 22 | 20080180616 | Transflective Liquid Crystal Display Device |
| 23 | 20080180601 | Liquid crystal display device |
| 24 | 20080180455 | Image processing apparatus and image displaying device |
| 25 | 20080180019 | Image display device |
| 26 | 20080179732 | Working Method of Metal Material and Semiconductor Apparatus Fabricated by the Method |
| 27 | 20080179536 | Changed particle beam emitting device and method for adjusting the optical axis |
| 28 | 20080179517 | Sample dimension measuring method and scanning electron microscope |
