20 US patents granted on 02 September 2008 and assigned to Micron
| 1 | 7,421,630 | Apparatus and methods for testing memory devices |
| 2 | 7,421,607 | Method and apparatus for providing symmetrical output data for a double data rate DRAM |
| 3 | 7,421,606 | DLL phase detection using advanced phase equalization |
| 4 | 7,421,121 | Spectral normalization using illuminant exposure estimation |
| 5 | 7,420,849 | Memory device distributed controller system |
| 6 | 7,420,361 | Method for improving stability and lock time for synchronous circuits |
| 7 | 7,420,240 | Method to remove an oxide seam along gate stack edge, when nitride space formation begins with an oxide liner surrounding gate stack |
| 8 | 7,420,239 | Dielectric layer forming method and devices formed therewith |
| 9 | 7,420,238 | Semiconductor constructions |
| 10 | 7,420,233 | Photodiode for improved transfer gate leakage |
| 11 | 7,420,154 | Pixel circuit with non-destructive readout circuit and methods of operation thereof |
| 12 | 7,419,913 | Methods of forming openings into dielectric material |
| 13 | 7,419,895 | NAND memory arrays |
| 14 | 7,419,871 | Methods of forming semiconductor constructions |
| 15 | 7,419,865 | Methods of forming memory circuitry |
| 16 | 7,419,854 | Methods for packaging image sensitive electronic devices |
| 17 | 7,419,852 | Low temperature methods of forming back side redistribution layers in association with through wafer interconnects, semiconductor devices including same, and assemblies |
| 18 | 7,419,841 | Microelectronic imagers and methods of packaging microelectronic imagers |
| 19 | 7,419,768 | Methods of fabricating integrated circuitry |
| 20 | 7,419,299 | Methods of sensing temperature of an electronic device workpiece |
