Fujitsu patent applications published on 05 May 2016

23 US patent applications published on 05 May 2016 and assigned to Fujitsu

1 20160127916 WIRELESS NETWORK DEPLOYMENT METHOD, APPARATUS AND SYSTEM
2 20160127735 MOTION PICTURE ENCODING DEVICE AND MOTION PICTURE DECODING DEVICE
3 20160127227 INFORMATION PROCESSING SYSTEM, METHOD, AND APPARATUS
4 20160127213 INFORMATION PROCESSING DEVICE AND METHOD
5 20160127100 METHOD FOR TRIGGERING APERIODIC SOUNDING REFERENCE SYMBOL, BASE STATION AND USER EQUIPMENT
6 20160127091 BIT ALLOCATION METHOD, APPARATUS FOR MULTICARRIER MODULATION SIGNAL, AND SYSTEM
7 20160126166 FLIP-CHIP ON LEADFRAME SEMICONDUCTOR PACKAGING STRUCTURE AND FABRICATION METHOD THEREOF
8 20160125834 COMMUNICATION DEVICE
9 20160125436 COMPUTER-READABLE MEDIUM, SYSTEM AND METHOD
10 20160125262 IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD
11 20160125030 SYSTEM, METHOD AND RECORDING MEDIUM
12 20160124941 TRANSLATION DEVICE, TRANSLATION METHOD, AND NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM HAVING THEREIN TRANSLATION PROGRAM
13 20160124795 EVALUATION METHOD AND APPARATUS
14 20160124779 LAUNCH CONTROL METHOD AND LAUNCH CONTROL APPARATUS
15 20160124485 COMPUTER SYSTEM HAVING AN ABSENCE MODE
16 20160124474 EVAPORATOR, COOLING DEVICE, AND ELECTRONIC APPARATUS
17 20160124020 SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
18 20160124019 SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
19 20160124018 TESTING PROBE, SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
20 20160124017 TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF
21 20160124016 TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF
22 20160123797 METHOD OF MEASURING CHARACTERISTICS OF CRYSTAL UNIT
23 20160123249 KNOCK DETERMINATION APPARATUS FOR INTERNAL COMBUSTION ENGINE