Fujitsu patent applications published on 24 May 2007

25 US patent applications published on 24 May 2007 and assigned to Fujitsu

1 20070118811 Information display system having graphical user interface switchingly controlling information display on display screen
2 20070118368 Audio encoding apparatus and audio encoding method
3 20070118363 Voice speed control apparatus
4 20070118342 Mesh creating device, mesh creating method and mesh creating program
5 20070117303 Semiconductor memory device (as amended)
6 20070117272 Method of making a semiconductor device with improved heat dissipation
7 20070117231 Semiconductor integrated circuit device having diagonal direction wiring and layout method therefor
8 20070116406 Switch
9 20070116404 Method and apparatus for controlling optical switch
10 20070116399 Optical element, manufacturing method of the optical element and driving method of the same
11 20070116165 Asynchronous transmission device, asynchronous transmission method
12 20070116065 Communication system, communication method, transmitter and receiver
13 20070115747 Semiconductor device including voltage level conversion output circuit
14 20070115588 Storage apparatus, magnetic head driving device, and relay flexible printed circuit board
15 20070115362 Method of detecting inclination and inclination detecting apparatus
16 20070115278 CAD method with capability of correcting dimension line with changes, recording medium storing CAD program, and CAD apparatus thereof
17 20070115168 RADAR APPARATUS
18 20070115159 ANALOG-TO-DIGITAL CONVERTER
19 20070115041 Level conversion circuit
20 20070115005 Sensor detection apparatus and sensor
21 20070114642 Semiconductor device having a heat spreader exposed from a seal resin
22 20070114617 Semiconductor memory device
23 20070114603 Semiconductor device and manufacturing method of the same
24 20070114590 Semiconductor device and method of manufacturing the same
25 20070114410 Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test