Fujitsu patents granted on 26 June 2012

25 US patents granted on 26 June 2012 and assigned to Fujitsu

1 8,209,670 Program conversion program, program conversion apparatus and program conversion method
2 8,209,502 Semiconductor integrated circuit and access controlling method of semiconductor memory
3 8,209,440 Device-configuration-information optimum arrangement method and device-configuration-information optimum arrangement system
4 8,209,345 User information management device for content provision, processing method, and computer-readable non transitory storage medium storing program
5 8,209,043 Assembly information management apparatus, and assembly information management method
6 8,208,897 Portable wireless terminal and its security system
7 8,208,880 Frequency control device, frequency control method, base station apparatus, and mobile station apparatus
8 8,208,862 Wireless system
9 8,208,730 Word search using handwriting recognition input with dictionary-based correction suggestions
10 8,208,623 Echo processing method and device
11 8,208,614 Reliability authorizing method, reliability authorizing device, and reliability authorizing system
12 8,208,589 Receiver and reception processing method
13 8,208,562 Transcoding device, transcoder, decoder, and transcoding method
14 8,208,469 Communication system and apparatus
15 8,207,838 Eco-drive assist apparatus and method
16 8,207,803 Electromagnetic relay
17 8,207,719 Series regulator circuit and semiconductor integrated circuit
18 8,207,653 Piezoelectric generating apparatus
19 8,207,610 Semiconductor device having a multilayer interconnection structure
20 8,207,465 Key switch unit
21 8,207,067 Method of processing resist, semiconductor device, and method of producing the same
22 8,207,059 Silicon compound, ultraviolet absorbent, method for manufacturing multilayer wiring device and multilayer wiring device
23 8,207,042 Semiconductor device and method of manufacturing the same
24 8,207,039 Method of manufacturing semiconductor device
25 8,206,550 Method and system for manufacturing semiconductor device having less variation in electrical characteristics