Hitachi patent applications published on 03 September 2009

27 US patent applications published on 03 September 2009 and assigned to Hitachi

1 20090222844 Optical Disc Apparatus
2 20090222631 Storage system and data migration method
3 20090222415 EVALUATING RISK OF INFORMATION MISMANAGEMENT IN COMPUTER STORAGE
4 20090221335 Hinge Apparatus and Portable Electronic Device
5 20090221259 ACTIVE MIXER CIRCUIT AND A RECEIVER CIRCUIT OR A MILLIMETER-WAVE COMMUNICATION UNIT USING IT
6 20090221060 NUCLEIC ACID ANALYZER
7 20090220897 RADIATION CURABLE COMPOSITION, STORING METHOD THEREOF, FORMING METHOD OF CURED FILM, PATTERNING METHOD, USE OF PATTERN, ELECTRONIC COMPONENTS AND OPTICAL WAVEGUIDE
8 20090220863 LITHIUM ION SECONDARY BATTERY
9 20090220862 LITHIUM SECONDARY BATTERY
10 20090220817 Hydrated water-absorption polymer containing resin composition, porous body and insulated wire using same, method of making the wire and coaxial cable
11 20090220401 EXHAUST SMOKE DENITRATING APPARATUS AND METHOD OF EXHAUST SMOKE DENITRATION
12 20090219466 Electro-Optical Device and Display Device
13 20090219247 FLEXIBLE INFORMATION DISPLAY TERMINAL AND INTERFACE FOR INFORMATION DISPLAY
14 20090219241 Liquid crystal display device
15 20090219106 TWO-PORT ISOLATOR
16 20090219069 Semiconductor integrated circuit device
17 20090218906 ROTATING ELECTRIC MACHINE AND METHOD OF MANUFACTURING THE SAME
18 20090218575 Display device and manufacturing method thereof
19 20090218574 Display device and manufacturing method therefor
20 20090218540 ROTATING MACHINE, BONDED MAGNET, MAGNET ROLL, AND METHOD FOR PRODUCING SINTERED FERRITE MAGNET
21 20090218510 SPECIMEN STAGE
22 20090218509 CHARGED PARTICLE BEAM APPARATUS
23 20090218507 CHARGED PARTICLE BEAM DEVICE
24 20090218490 APPARATUS AND METHOD OF SEMICONDUCTOR DEFECT INSPECTION
25 20090218267 SEPARATION COLUMN AND LIQUID CHROMATOGRAPH
26 20090218179 Electric Brake
27 20090217656 Hydraulically Driven Industrial Machine