Hitachi patent applications published on 31 July 2008

28 US patent applications published on 31 July 2008 and assigned to Hitachi

1 20080184347 Storage system and method for connecting additional storage apparatus
2 20080184255 Storage apparatus and load distribution method
3 20080184000 STORAGE MODULE AND CAPACITY POOL FREE CAPACITY ADJUSTMENT METHOD
4 20080183994 STORAGE SYSTEM
5 20080183993 Method for remote backup and storage system
6 20080183871 Storage system comprising function for alleviating performance bottleneck
7 20080183841 Application software and data management method, management system, and thin client terminal, management server and remote computer used therefor
8 20080183774 CONTROL DEVICE AND METHOD FOR DATA MIGRATION BETWEEN NAS DEVICES
9 20080183432 Environmental information aggregating apparatus and method
10 20080183348 Hybrid Cruising Control System
11 20080182612 Radio Communication System and Base Station
12 20080182426 Method for growing nitride semiconductor
13 20080182414 MASS PRODUCTION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD OF ELECTRONIC DEVICE
14 20080182345 Substrate processing method and semiconductor manufacturing apparatus
15 20080182159 CYLINDRICAL SECONDARY BATTERY
16 20080182134 Perpendicular magnetic recording media and magnetic storage apparatus using the same
17 20080181604 Optical access system
18 20080181349 Nuclear Power Plant and Operation Method Thereof
19 20080181312 Television receiver apparatus and a frame-rate converting method for the same
20 20080181090 Objective lens optical system and light beam splitting element
21 20080180839 Magnetic disk drive
22 20080180616 Transflective Liquid Crystal Display Device
23 20080180601 Liquid crystal display device
24 20080180455 Image processing apparatus and image displaying device
25 20080180019 Image display device
26 20080179732 Working Method of Metal Material and Semiconductor Apparatus Fabricated by the Method
27 20080179536 Changed particle beam emitting device and method for adjusting the optical axis
28 20080179517 Sample dimension measuring method and scanning electron microscope