Micron patent applications published on 18 June 2009

21 US patent applications published on 18 June 2009 and assigned to Micron

1 20090158111 SELF-TIMED ERROR CORRECTING CODE EVALUATION SYSTEM AND METHOD
2 20090158102 Methods, devices, and systems for experiencing reduced unequal testing degradation
3 20090157376 Techniques for Incorporating Timing Jitter and/or Amplitude Noise into Hardware Description Language-based Input Stimuli
4 20090155976 ATOMIC LAYER DEPOSITION OF DY-DOPED HFO2 FILMS AS GATE DIELECTRICS
5 20090155970 ENHANCED MULTI-BIT NON-VOLATILE MEMORY DEVICE WITH RESONANT TUNNEL BARRIER
6 20090155966 DRAM WITH NANOFIN TRANSISTORS
7 20090155486 METHODS OF MAKING CRYSTALLINE TANTALUM PENTOXIDE
8 20090154255 Symmetrically operating single-ended input buffer devices and methods
9 20090154254 CLUSTER BASED NON-VOLATILE MEMORY TRANSLATION LAYER
10 20090154247 PROGRAMMING MEMORY DEVICES
11 20090154238 PROGRAMMING MULTILEVEL CELL MEMORY ARRAYS
12 20090154228 Random Access Memory Employing Read Before Write for Resistance Stabilization
13 20090153253 SYSTEM AND METHOD FOR REDUCING LOCK TIME IN A PHASE-LOCKED LOOP
14 20090153237 COMPENSATION CAPACITOR NETWORK FOR DIVIDED DIFFUSED RESISTORS FOR A VOLTAGE DIVIDER
15 20090153205 METHODS, DEVICES, AND SYSTEMS FOR A DELAY LOCKED LOOP HAVING A FREQUENCY DIVIDED FEEDBACK CLOCK
16 20090153191 PRE-DRIVER LOGIC
17 20090153181 DATA RETENTION KILL FUNCTION
18 20090152737 MEMORY DEVICES HAVING CONTACT FEATURES
19 20090152645 METHODS FOR ISOLATING PORTIONS OF A LOOP OF PITCH-MULTIPLIED MATERIAL AND RELATED STRUCTURES
20 20090152629 METHODS OF SELECTIVELY OXIDIZING SEMICONDUCTOR STRUCTURES, AND STRUCTURES RESULTING THEREFROM
21 20090152620 ATOMIC LAYER DEPOSITION OF GdScO3 FILMS AS GATE DIELECTRICS