Micron patent applications published on 19 October 2006

26 US patent applications published on 19 October 2006 and assigned to Micron

1 20060236207 Error detection, documentation, and correction in a flash memory device
2 20060236170 On-chip sampling circuit and method
3 20060236164 Automatic test entry termination in a memory device
4 20060235663 METHOD AND DEVICE FOR CHECKING LITHOGRAPHY DATA
5 20060234604 Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
6 20060234492 Methods of forming polysilicon-comprising plugs and methods of forming FLASH memory circuitry
7 20060234469 A method of forming semiconductor structures
8 20060234450 Programmable array logic or memory with p-channel devices and asymmetrical tunnel barriers
9 20060234425 Method of manufacture of a PCRAM memory cell
10 20060234393 Scalable high density non-volatile memory cells in a contactless memory array
11 20060234140 METHOD AND DEVICE FOR CHECKING LITHOGRAPHY DATA
12 20060233463 APPARATUS, METHOD, AND PRODUCT FOR DOWNSCALING AN IMAGE
13 20060233036 Power savings mode for memory systems
14 20060233030 System and method for enhanced mode register definitions
15 20060233025 Techniques for implementing accurate operating current values stored in a database
16 20060232676 Column-parallel sigma-delta analog-to-digital conversion for imagers
17 20060232323 Circuit and method for stable fuse detection
18 20060231922 GATE DIELECTRIC ANTIFUSE CIRCUIT TO PROTECT A HIGH-VOLTAGE TRANSISTOR
19 20060231886 Programmable array logic or memory with p-channel devices and asymmetrical tunnel barriers
20 20060231879 Merged MOS-bipolar capacitor memory cell
21 20060231875 Dual conversion gain pixel using Schottky and ohmic contacts to the floating diffusion region and methods of fabrication and operation
22 20060231823 Structure for amorphous carbon based non-volatile memory
23 20060231734 Generation and storage of column offsets for a column parallel image sensor
24 20060231733 Multi-point correlated sampling for image sensors
25 20060231732 Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor
26 20060231017 Atomic layer deposition methods and chemical vapor deposition methods