14 US patent applications published on 21 January 2010 and assigned to Micron
| 1 | 20100017778 | METHODS FOR DEFINING EVALUATION POINTS FOR OPTICAL PROXIMITY CORRECTION AND OPTICAL PROXIMITY CORRECTION METHODS INCLUDING SAME |
| 2 | 20100017665 | DEFECTIVE MEMORY BLOCK IDENTIFICATION IN A MEMORY DEVICE |
| 3 | 20100015813 | GAP PROCESSING |
| 4 | 20100014805 | ZINC OXIDE DIODES FOR OPTICAL INTERCONNECTIONS |
| 5 | 20100014377 | METHOD AND APPARATUS FOR REDUCING OSCILLATION IN SYNCHRONOUS CIRCUITS |
| 6 | 20100014364 | MEMORY SYSTEM AND METHOD USING STACKED MEMORY DEVICE DICE, AND SYSTEM USING THE MEMORY SYSTEM |
| 7 | 20100014352 | NON-VOLATILE MEMORY CELL READ FAILURE REDUCTION |
| 8 | 20100013512 | APPARATUS AND METHODS FOR THROUGH SUBSTRATE VIA TEST |
| 9 | 20100013510 | SYSTEMS AND METHODS FOR DEFECT TESTING OF EXTERNALLY ACCESSIBLE INTEGRATED CIRCUIT INTERCONNECTS |
| 10 | 20100013107 | INTERCONNECT STRUCTURES FOR INTEGRATION OF MULTI-LAYERED INTEGRATED CIRCUIT DEVICES AND METHODS FOR FORMING THE SAME |
| 11 | 20100013074 | HIGH DENSITY STACKED DIE ASSEMBLIES, STRUCTURES INCORPORATED THEREIN AND METHODS OF FABRICATING THE ASSEMBLIES |
| 12 | 20100013061 | SEMICONDUCTOR STRUCTURES INCLUDING SQUARE CUTS IN SINGLE CRYSTAL SILICON |
| 13 | 20100013041 | MICROELECTRONIC IMAGER PACKAGES WITH COVERS HAVING NON-PLANAR SURFACE FEATURES |
| 14 | 20100012922 | METHODS OF FORMING STRUCTURES INCLUDING NANOTUBES AND STRUCTURES INCLUDING SAME |
