15 US patent applications published on 21 May 2009 and assigned to Micron
| 1 | 20090132889 | MEMORY CONTROLLER SUPPORTING RATE-COMPATIBLE PUNCTURED CODES |
| 2 | 20090132755 | FAULT-TOLERANT NON-VOLATILE INTEGRATED CIRCUIT MEMORY |
| 3 | 20090130852 | PROCESS FOR IMPROVING CRITICAL DIMENSION UNIFORMITY OF INTEGRATED CIRCUIT ARRAYS |
| 4 | 20090130807 | Trench DRAM Cell with Vertical Device and Buried Word Lines |
| 5 | 20090129438 | Devices and methods for reducing effects of device mismatch in temperature sensor circuits |
| 6 | 20090129188 | Devices and methods for a threshold voltage difference compensated sense amplifier |
| 7 | 20090129169 | METHOD AND APPARATUS FOR READING DATA FROM FLASH MEMORY |
| 8 | 20090129167 | SEMICONDUCTOR MAGNETIC MEMORY INTEGRATING A MAGNETIC TUNNELING JUNCTION ABOVE A FLOATING-GATE MEMORY CELL |
| 9 | 20090128991 | Methods and apparatuses for stacked capacitors for image sensors |
| 10 | 20090127689 | MICROELECTRONIC DEVICE PACKAGES, STACKED MICROELECTRONIC DEVICE PACKAGES, AND METHODS FOR MANUFACTURING MICROELECTRONIC DEVICES |
| 11 | 20090127614 | SCALABLE MULTI-FUNCTIONAL AND MULTI-LEVEL NANO-CRYSTAL NON-VOLATILE MEMORY DEVICE |
| 12 | 20090127592 | FIN-JFET |
| 13 | 20090127437 | METHOD AND APPARATUS FOR REDUCING DARK CURRENT AND HOT PIXELS IN CMOS IMAGE SENSORS |
| 14 | 20090127436 | METHOD AND APPARATUS FOR CONTROLLING ANTI-BLOOMING TIMING TO REDUCE EFFECTS OF DARK CURRENT |
| 15 | 20090127105 | SYSTEMS AND METHODS FOR FORMING NIOBIUM AND/OR VANADIUM CONTAINING LAYERS USING ATOMIC LAYER DEPOSITION |
