21 US patents granted on 02 February 2010 and assigned to Micron
| 1 | 7,657,813 | Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
| 2 | 7,657,802 | Data compression read mode for memory testing |
| 3 | 7,657,723 | System and method for processor with predictive memory retrieval assist |
| 4 | 7,656,961 | Method and apparatus for multi-user transmission |
| 5 | 7,656,768 | Phase masks for use in holographic data storage |
| 6 | 7,656,745 | Circuit, system and method for controlling read latency |
| 7 | 7,656,740 | Wordline voltage transfer apparatus, systems, and methods |
| 8 | 7,656,720 | Power-off apparatus, systems, and methods |
| 9 | 7,656,709 | NAND step up voltage switching method |
| 10 | 7,656,209 | Output slew rate control |
| 11 | 7,656,049 | CMOS device with asymmetric gate strain |
| 12 | 7,656,012 | Apparatus for use in semiconductor wafer processing for laterally displacing individual semiconductor devices away from one another |
| 13 | 7,656,006 | Antifuse circuit with well bias transistor |
| 14 | 7,655,973 | Recessed channel negative differential resistance-based memory cell |
| 15 | 7,655,968 | Semiconductor devices |
| 16 | 7,655,508 | Overmolding encapsulation process and encapsulated article made therefrom |
| 17 | 7,655,507 | Microelectronic imaging units and methods of manufacturing microelectronic imaging units |
| 18 | 7,655,500 | Packaged microelectronic devices and methods for packaging microelectronic devices |
| 19 | 7,655,387 | Method to align mask patterns |
| 20 | 7,655,384 | Methods for reducing spherical aberration effects in photolithography |
| 21 | 7,655,095 | Method of cleaning semiconductor surfaces |
