23 US patents granted on 03 July 2007 and assigned to Micron
| 1 | 7,240,316 | Apparatus and method to facilitate hierarchical netlist checking |
| 2 | 7,240,148 | Parity-scanning and refresh in dynamic memory devices |
| 3 | 7,240,147 | Memory decoder and data bus for burst page read |
| 4 | 7,240,146 | Random access interface in a serial memory device |
| 5 | 7,239,933 | Substrate supports for use with programmable material consolidation apparatus and systems |
| 6 | 7,239,932 | Methods and apparatus for calibrating programmable material consolidation apparatus |
| 7 | 7,239,575 | Delay-locked loop having a pre-shift phase detector |
| 8 | 7,239,557 | Program method with optimized voltage level for flash memory |
| 9 | 7,239,552 | Non-volatile one time programmable memory |
| 10 | 7,239,381 | Particle detection method |
| 11 | 7,239,152 | Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer |
| 12 | 7,239,075 | Nitrogen and phosphorus doped amorphous silicon as resistor for field emission display device baseplate |
| 13 | 7,239,029 | Packages for semiconductor die |
| 14 | 7,239,025 | Selective deposition of solder ball contacts |
| 15 | 7,239,015 | Heat sinks including nonlinear passageways |
| 16 | 7,239,003 | Isolation techniques for reducing dark current in CMOS image sensors |
| 17 | 7,238,981 | Metal-poly integrated capacitor structure |
| 18 | 7,238,977 | Wide dynamic range sensor having a pinned diode with multiple pinned voltages |
| 19 | 7,238,616 | Photo-assisted method for semiconductor fabrication |
| 20 | 7,238,613 | Diffusion-enhanced crystallization of amorphous materials to improve surface roughness |
| 21 | 7,238,599 | Multi-state NROM device |
| 22 | 7,238,544 | Imaging with gate controlled charge storage |
| 23 | 7,238,543 | Methods for marking a bare semiconductor die including applying a tape having energy-markable properties |
