21 US patents granted on 10 August 2010 and assigned to Micron
| 1 | 7,774,683 | Erasure pointer error correction |
| 2 | 7,774,559 | Method and system for terminating write commands in a hub-based memory system |
| 3 | 7,774,536 | Power up initialization for memory |
| 4 | 7,773,492 | Method and apparatus providing high density data storage |
| 5 | 7,773,441 | Memory malfunction prediction system and method |
| 6 | 7,773,418 | Non-volatile memory with both single and multiple level cells |
| 7 | 7,773,412 | Method and apparatus for providing a non-volatile memory with reduced cell capacitive coupling |
| 8 | 7,772,908 | Voltage and temperature compensation delay system and method |
| 9 | 7,772,680 | Arrangements of fuse-type constructions |
| 10 | 7,772,672 | Semiconductor constructions |
| 11 | 7,772,635 | Non-volatile memory device with tensile strained silicon layer |
| 12 | 7,772,633 | DRAM cells with vertical transistors |
| 13 | 7,772,632 | Memory arrays and methods of fabricating memory arrays |
| 14 | 7,772,583 | Memory devices and methods of forming the same |
| 15 | 7,772,537 | Linear distributed pixel differential amplifier having mirrored inputs |
| 16 | 7,772,116 | Methods of forming blind wafer interconnects |
| 17 | 7,772,115 | Methods for forming through-wafer interconnects, intermediate structures so formed, and devices and systems having at least one solder dam structure |
| 18 | 7,772,066 | DRAM tunneling access transistor |
| 19 | 7,771,917 | Methods of making templates for use in imprint lithography |
| 20 | 7,771,537 | Methods and systems for controlling temperature during microfeature workpiece processing, E.G. CVD deposition |
| 21 | 7,771,115 | Temperature sensor circuit, device, system, and method |
