Micron patents granted on 12 February 2008

31 US patents granted on 12 February 2008 and assigned to Micron

1 RE40,061 Multi-chip stacked devices
2 7,330,992 System and method for read synchronization of memory modules
3 7,330,929 CAM modified to be used for statistic calculation in network switches and routers
4 7,330,869 Hybrid arithmetic logic unit
5 7,330,393 Memory array decoder
6 7,330,390 Noise resistant small signal sensing circuit for a memory device
7 7,330,382 Programmable DQS preamble
8 7,330,367 Stacked 1T-nMTJ MRAM structure
9 7,330,211 Camera module with focus adjustment structure and systems and methods of making the same
10 7,330,146 Minimized SAR-type column-wide ADC for image sensors
11 7,330,036 Engagement Probes
12 7,329,949 Packaged microelectronic devices and methods for packaging microelectronic devices
13 7,329,945 Flip-chip adaptor package for bare die
14 7,329,943 Microelectronic devices and methods for forming interconnects in microelectronic devices
15 7,329,924 Integrated circuits and methods of forming a field effect transistor
16 7,329,920 Trench corner effect bidirectional flash memory cell
17 7,329,917 Permeable capacitor electrode
18 7,329,910 Semiconductor substrates and field effect transistor constructions
19 7,329,899 Wafer-level redistribution circuit
20 7,329,861 Integrally packaged imaging module
21 7,329,856 Image sensor having integrated infrared-filtering optical device and related method
22 7,329,618 Ion implanting methods
23 7,329,615 Atomic layer deposition method of forming an oxide comprising layer on a substrate
24 7,329,607 Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby
25 7,329,576 Double-sided container capacitors using a sacrificial layer
26 7,329,573 Methods of forming capacitors
27 7,329,558 Differential negative resistance memory
28 7,329,552 Field effect transistor fabrication methods, field emission device fabrication methods, and field emission device operational methods
29 7,329,292 Process byproduct trap and system including same
30 7,329,168 Extended Kalman filter incorporating offline metrology
31 7,328,517 Method and apparatus for measurement of thickness and warpage of substrates