Micron patents granted on 18 December 2007

11 US patents granted on 18 December 2007 and assigned to Micron

1 7,310,752 System and method for on-board timing margin testing of memory modules
2 7,310,748 Memory hub tester interface and method for use thereof
3 7,310,276 Memory device and method having data path with multiple prefetch I/O configurations
4 7,310,259 Access circuit and method for allowing external test voltage to be applied to isolated wells
5 7,310,257 Local digit line architecture and method for memory devices having multi-bit or low capacitance memory cells
6 7,310,252 Closed-loop high voltage booster
7 7,310,018 Method and apparatus providing input buffer design using common-mode feedback
8 7,310,013 Method, apparatus, and system for low voltage temperature sensing
9 7,309,889 Constructions comprising perovskite-type dielectric
10 7,309,623 Method of fabricating a stacked die in die BGA package
11 7,309,549 Method for quartz bump defect repair with less substrate damage