13 US patents granted on 19 January 2010 and assigned to Micron
| 1 | 7,650,541 | Memory block quality identification in a memory device |
| 2 | 7,649,783 | Delayed activation of selected wordlines in memory |
| 3 | 7,649,316 | Assemblies for plasma-enhanced treatment of substrates |
| 4 | 7,649,201 | Raised photodiode sensor to increase fill factor and quantum efficiency in scaled pixels |
| 5 | 7,649,145 | Compliant spring contact structures |
| 6 | 7,648,926 | Systems and methods for forming metal oxides using metal diketonates and/or ketoimines |
| 7 | 7,648,915 | Methods of forming semiconductor constructions, and methods of recessing materials within openings |
| 8 | 7,648,900 | Vias having varying diameters and fills for use with a semiconductor device and methods of forming semiconductor device structures including same |
| 9 | 7,648,873 | Methods of forming capacitors |
| 10 | 7,648,872 | Methods of forming DRAM arrays |
| 11 | 7,648,856 | Methods for attaching microfeature dies to external devices |
| 12 | 7,648,806 | Phase shift mask with two-phase clear feature |
| 13 | 7,647,886 | Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers |
