Micron patents granted on 28 October 2008

34 US patents granted on 28 October 2008 and assigned to Micron

1 7,444,579 Non-systematic coded error correction
2 7,444,559 Generation of memory test patterns for DLL calibration
3 7,444,550 System and method for communicating a software-generated pulse waveform between two servers in a network
4 7,444,537 System and method for communicating a software-generated pulse waveform between two servers in a network
5 7,444,458 Method for assigning addresses to memory devices
6 7,444,030 Image encoding with dynamic buffer-capacity-level-based compression adjustment
7 7,443,761 Loop filtering for fast PLL locking
8 7,443,750 Switched capacitor DRAM sense amplifier with immunity to mismatch and offsets
9 7,443,749 Switched capacitor DRAM sense amplifier with immunity to mismatch and offsets
10 7,443,743 Method and system for improved efficiency of synchronous mirror delays and delay locked loops
11 7,443,715 SRAM cells with repressed floating gate memory, low tunnel barrier interpoly insulators
12 7,443,437 Image sensor with a gated storage node linked to transfer gate
13 7,443,427 Wide dynamic range linear-and-log active pixel
14 7,443,219 Phase interpolation apparatus, systems, and methods
15 7,443,216 Trimmable delay locked loop circuitry with improved initialization characteristics
16 7,443,038 Flip-chip image sensor packages
17 7,443,032 Memory device with chemical vapor deposition of titanium for titanium silicide contacts
18 7,443,022 Board-on-chip packages
19 7,443,009 N well implants to separate blocks in a flash memory device
20 7,443,006 Photon amplification of image sensors
21 7,442,979 Reduced cell-to-cell shorting for memory arrays
22 7,442,977 Gated field effect devices
23 7,442,976 DRAM cells with vertical transistors
24 7,442,970 Active photosensitive structure with buried depletion layer
25 7,442,910 High dynamic range cascaded integration pixel cell
26 7,442,655 Selective oxidation methods and transistor fabrication methods
27 7,442,643 Methods of forming conductive elements using organometallic layers and flowable, curable conductive materials
28 7,442,633 Decoupling capacitor for high frequency noise immunity
29 7,442,608 Methods of fabricating a semiconductor device using angled implantation
30 7,442,600 Methods of forming threshold voltage implant regions
31 7,442,578 Underfill compounds including electrically charged filler elements, microelectronic devices having underfill compounds including electrically charged filler elements, and methods of underfilling micoelectronic devices
32 7,442,472 Methods of forming reticles
33 7,442,319 Poly etch without separate oxide decap
34 7,441,949 System and method for providing temperature data from a memory device having a temperature sensor