Toshiba patent applications published on 11 February 2016

23 US patent applications published on 11 February 2016 and assigned to Toshiba

1 20160043311 MEMORY DEVICE
2 20160043183 SEMICONDUCTOR WAFER, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR LAYER
3 20160043141 MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
4 20160043140 MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
5 20160043130 SOLID-STATE IMAGING DEVICE
6 20160043037 MARK, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR WAFER
7 20160042801 NONVOLATILE SEMICONDUCTOR MEMORY
8 20160042800 SEMICONDUCTOR MEMORY DEVICE
9 20160042103 TEST APPARATUS, TEST METHOD AND TEST SYSTEM FOR VARIABLE SPEED CONTROLLER
10 20160041875 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME
11 20160041871 INFORMATION PROCESSING APPARATUS
12 20160041858 INFORMATION PROCESSING DEVICE, EXTERNAL STORAGE DEVICE, HOST DEVICE, RELAY DEVICE, CONTROL PROGRAM, AND CONTROL METHOD OF INFORMATION PROCESSING DEVICE
13 20160041793 SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR CONTROLLING NONVOLATILE SEMICONDUCTOR MEMORY
14 20160041767 MEMORY SYSTEM AND CONTROL METHOD THEREOF
15 20160041549 PRODUCTION SUPPORT SYSTEM AND PRODUCTION SUPPORT METHOD
16 20160041479 FOCUS CORRECTION METHOD, FOCUS CORRECTION APPARATUS AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM
17 20160041215 SURFACE POTENTIAL DISTRIBUTION MEASURING DEVICE
18 20160041160 SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN MEASUREMENT METHOD
19 20160040310 HYDROGEN PRODUCTION SYSTEM AND METHOD FOR PRODUCING HYDROGEN
20 20160038115 X-RAY DIAGNOSTIC APPARATUS
21 20160038110 SUPPORTING DEVICE AND X-RAY DIAGNOSTIC APPARATUS
22 20160038108 X-RAY CT APPARATUS
23 20160038100 X RAY COMPUTED TOMOGRAPHY APPARATUS, A TOP PLATE CONTROL APPARATUS AND A TOP PLATE CONTROL METHOD