Toshiba patent applications published on 16 May 2013

27 US patent applications published on 16 May 2013 and assigned to Toshiba

1 20130125149 DATA PROCESSING APPARATUS
2 20130124884 INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD
3 20130124676 CONTENT DISTRIBUTION APPARATUS AND METHOD
4 20130124585 FILE PROCESSING APPARATUS AND FILE PROCESSING METHOD
5 20130124210 INFORMATION TERMINAL, CONSUMER ELECTRONICS APPARATUS, INFORMATION PROCESSING METHOD AND INFORMATION PROCESSING PROGRAM
6 20130122890 WIRELESS COMMUNICATION DEVICE AND WIRELESS COMMUNICATION METHOD
7 20130122721 ULTRAVIOLET-CURING RESIN MATERIAL FOR PATTERN TRANSFER AND MAGNETIC RECORDING MEDIUM MANUFACTURING METHOD USING THE SAME
8 20130122626 NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME
9 20130121081 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
10 20130121077 THREE DIMENSIONAL STACKED NONVOLATILE SEMICONDUCTOR MEMORY
11 20130121076 THREE DIMENSIONAL STACKED NONVOLATILE SEMICONDUCTOR MEMORY
12 20130120888 CURRENT DIFFERENTIAL REPLAY APPARATUS
13 20130120877 HEAD IC AND MAGNETIC DISK APPARATUS HAVING MICROWAVE ASSISTANCE FUNCTION
14 20130120527 ELECTRONIC APPARATUS AND DISPLAY CONTROL METHOD
15 20130120236 INFORMATION PROCESSING APPARATUS AND CONTROL METHOD
16 20130120069 HIGH FREQUENCY AMPLIFIER
17 20130119896 STRAIGHT TUBE LED LAMP, LAMP SOCKET SET, AND LIGHTING FIXTURE
18 20130119879 Lighting Power Source and Luminaire
19 20130119878 Lighting Power Source and Luminaire
20 20130119866 Luminaire and Lighting Method
21 20130119860 Switching Power Supply Apparatus And Luminaire
22 20130119550 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
23 20130119531 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
24 20130119526 LEAD FRAME, SEMICONDUCTOR MANUFACTURING APPARATUS, AND SEMICONDUCTOR DEVICE
25 20130119506 FORMATION OF STI TRENCHES FOR LIMITING PN-JUNCTION LEAKAGE
26 20130119456 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
27 20130119251 METHOD AND APPARATUS FOR CHARGED PARTICLE BEAM INSPECTION