17 US patent applications published on 20 October 2016 and assigned to Toshiba
| 1 | 20160309478 | WIRELESS COMMUNICATION DEVICE AND WIRELESS COMMUNICATION METHOD |
| 2 | 20160309086 | ELECTRONIC DEVICE AND METHOD |
| 3 | 20160308464 | INVERTER CONTROL APPARATUS |
| 4 | 20160308444 | SWITCHING UNIT AND POWER SUPPLY CIRCUIT |
| 5 | 20160308202 | ELECTRODE AND NONAQUEOUS ELECTROLYTE BATTERY |
| 6 | 20160308115 | MAGNETORESISTIVE MEMORY DEVICE AND MANUFACTURING METHOD OF THE SAME |
| 7 | 20160307856 | MONOLITHIC MICROWAVE INTEGRATED CIRCUIT |
| 8 | 20160307853 | MULTILAYER SUBSTRATE, DESIGN METHOD OF MULTILAYER SUBSTRATE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND RECORDING MEDIUM |
| 9 | 20160307838 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING PILLARS BURIED INSIDE THROUGH HOLES SAME |
| 10 | 20160307638 | SEMICONDUCTOR MEMORY DEVICE |
| 11 | 20160307307 | MEDICAL IMAGE DIAGNOSTIC APPARATUS |
| 12 | 20160307304 | IMAGE PROCESSING APPARATUS AND X-RAY DIAGNOSTIC APPARATUS |
| 13 | 20160307280 | PRICE INFORMATION DETERMINATION DEVICE, PRICE INFORMATION OUTPUT SYSTEM, PRICE INFORMATION DETERMINATION METHOD AND PROGRAM |
| 14 | 20160306366 | LEAKAGE SUPPRESSION APPARATUS, LEAKAGE SUPPRESSION SYSTEM, AND LEAKAGE SUPPRESSION PROGRAM |
| 15 | 20160306005 | SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
| 16 | 20160305692 | RARE-EARTH REGENERATOR MATERIAL PARTICLES, AND GROUP OF RARE-EARTH REGENERATOR MATERIAL PARTICLES, REFRIGERATOR AND MEASURING APPARATUS USING THE SAME, AND METHOD FOR MANUFACTURING THE SAME |
| 17 | 20160302744 | X-RAY DIAGNOSTIC APPARATUS |
