Toshiba patents granted on 09 June 2015

57 US patents granted on 09 June 2015 and assigned to Toshiba

1 9,055,340 Apparatus and method for recommending information, and non-transitory computer readable medium thereof
2 9,055,236 Information processing apparatus and output switching control method
3 9,055,203 Image forming apparatus and storage method of print data
4 9,055,181 Solid-state imaging device, image processing apparatus, and a camera module having an image synthesizer configured to synthesize color information
5 9,054,890 Communication apparatus
6 9,054,778 Transmission line protective relay device
7 9,054,776 Signal transmission and reception system, installation method of the system, and plant applied with the system
8 9,054,739 Error correction device, error correction method and computer program product
9 9,054,701 Semiconductor device
10 9,054,633 Bias current circuit and semiconductor integrated circuit
11 9,054,622 Method of controlling a current of a motor and control device of a motor
12 9,054,429 Antenna apparatus and electronic device including antenna apparatus
13 9,054,413 Antenna apparatus and electronic device including antenna apparatus
14 9,054,393 Secondary battery and method of manufacturing the same
15 9,054,369 Nonaqueous electrolyte secondary battery and battery
16 9,054,332 Organic electroluminescent device and light emitting apparatus
17 9,054,324 Organic molecular memory
18 9,054,307 Resistive random access memory cells having metal alloy current limiting layers
19 9,054,229 Semiconductor light emitting device
20 9,054,171 HEMT semiconductor device
21 9,054,152 Semiconductor device
22 9,054,132 Method for manufacturing semiconductor device and semiconductor device
23 9,054,066 Semiconductor device
24 9,054,036 Nitride semiconductor device, nitride semiconductor wafer, and method for forming nitride semiconductor layer
25 9,053,995 Solid-state imaging device and method for manufacturing solid-state imaging device
26 9,053,931 Nitride semiconductor wafer, nitride semiconductor device, and method for manufacturing nitride semiconductor wafer
27 9,053,904 Image quality adjusting method, non-transitory computer-readable recording medium, and electron microscope
28 9,053,807 Non-volatile semiconductor memory device
29 9,053,805 Semiconductor memory device
30 9,053,786 Resistance-change memory
31 9,053,783 Nonvolatile semiconductor memory device
32 9,053,765 Nonvolatile semiconductor memory device
33 9,053,746 Disk device and data recording method
34 9,053,733 Magnetic recording medium with magnetic portions of different orientations and method of manufacturing the same
35 9,053,575 Image processing apparatus for generating an image for three-dimensional display
36 9,053,541 Image registration
37 9,053,172 Medical image processing apparatus, program, and medical apparatus
38 9,053,062 Memory chip for converting data received from controller controlling reading and writing of data
39 9,053,043 Method of error correction of a memory
40 9,053,016 Memory system
41 9,053,007 Memory system, controller, and method for controlling memory system
42 9,052,843 Card and host device
43 9,052,841 Electronic device and data transfer method
44 9,052,836 Memory system in which extension function can easily be set
45 9,052,367 MRI RF coil control signals modulated onto the RF coil clock signal
46 9,052,266 X-ray CT apparatus
47 9,052,187 Inspection apparatus and inspection method for semiconductor device
48 9,050,798 Ink-jet head and manufacturing method of the same
49 9,050,752 Imprint method
50 9,050,683 Laser dicing method
51 9,050,618 Double-sided coating apparatus and double-sided coating method
52 9,050,060 X-ray imaging system
53 9,050,058 X-ray diagnostic system and X-ray diagnostic method
54 9,050,054 Medical image diagnostic apparatus
55 9,050,038 Ultrasound diagnosis apparatus
56 9,050,020 Ultrasound diagnostic apparatus and image processing method
57 9,050,002 Image reconstructing apparatus, X-ray computed tomography apparatus, and image reconstructing method